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  Subjects -> ELECTRONICS (Total: 207 journals)
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Solid-State Electronics
Journal Prestige (SJR): 0.492
Citation Impact (citeScore): 2
Number of Followers: 12  
 
  Hybrid Journal Hybrid journal (It can contain Open Access articles)
ISSN (Print) 0038-1101 - ISSN (Online) 0038-1101
Published by Elsevier Homepage  [2974 journals]
  • Investigation of low to high-dose gamma-ray (γ-ray) radiation effects on
           indium-zinc-oxide (IZO) thin film transistor (TFT)

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      Abstract: Publication date: Available online 28 February 2024Source: Solid-State ElectronicsAuthor(s): Do-Kywn Kim, Dong-Seok Kim, Tae-Eon Kim, Min-Ju Kim, Seung Heon Shin
       
  • Bias stress stabilities of PMMA-passivated indium-gallium-zinc-oxide
           thin-film transistors after 100 °C steam exposure

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      Abstract: Publication date: Available online 28 February 2024Source: Solid-State ElectronicsAuthor(s): Yuyun Chen, Guodong Xu, Yunpeng Yu, Yi Shen
       
  • Improvement of power consumption and linearity of integrate/fire
           characteristics using diffusive memristors with defective graphene for
           artificial neuron application

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      Abstract: Publication date: May 2024Source: Solid-State Electronics, Volume 215Author(s): Moonkyu Song, Sangheon Lee, S.S. Teja Nibhanupudi, Siyu Wu, Sanjay K. Banerjee
       
  • Fabrication of garnet solid electrolytes via sputtering for solid-state
           batteries

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      Abstract: Publication date: Available online 24 February 2024Source: Solid-State ElectronicsAuthor(s): Shu-Yi Tsai, Kuan-Zong Fung
       
  • Analysis and 3D TCAD simulations of single-qubit control in an
           industrially-compatible FD-SOI device

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      Abstract: Publication date: Available online 23 February 2024Source: Solid-State ElectronicsAuthor(s): Pericles Philippopoulos, Félix Beaudoin, Philippe Galy
       
  • Process optimization of titanium self-aligned silicide formation through
           evaluation of sheet resistance by design of experiment methodology

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      Abstract: Publication date: Available online 17 February 2024Source: Solid-State ElectronicsAuthor(s): In-Chi Gau, Yao-Wen Chang, Giin-Shan Chen, Yi-Lung Cheng, Jau-Shiung Fang
       
  • Characterization of DC performance and low-frequency noise of an array of
           nMOS Forksheets from 300 K to 4 K

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      Abstract: Publication date: Available online 16 February 2024Source: Solid-State ElectronicsAuthor(s): R. Asanovski, A. Grill, J. Franco, P. Palestri, H. Mertens, R. Ritzenthaler, N. Horiguchi, B. Kaczer, L. Selmi
       
  • Mechanisms of negative bias instability of commercial SiC MOSFET observed
           by current transients

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      Abstract: Publication date: Available online 16 February 2024Source: Solid-State ElectronicsAuthor(s): Mayank Chaturvedi, Daniel Haasmann, Philip Tanner, Sima Dimitrijev
       
  • Impact of passivation layer on the subthreshold behavior of p-type CuO
           accumulation-mode thin-film transistors

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      Abstract: Publication date: April 2024Source: Solid-State Electronics, Volume 214Author(s): Qi Chen, Xi Zeng, Denis Flandre
       
  • Low-Frequency Noise Characterization of Positive Bias Stress Effect on the
           Spatial Distribution of Trap in β-Ga2O3 FinFET

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      Abstract: Publication date: Available online 15 February 2024Source: Solid-State ElectronicsAuthor(s): Hagyoul Bae, Geon Bum Lee, Jaewook Yoo, Khwang-Sun Lee, Ja-Yun Ku, Kihyun Kim, Jungsik Kim, Peide D. Ye, Jun-Young Park, Yang-Kyu Choi
       
  • Experimental study of time-dependent dielectric degradation by means of
           random telegraph noise spectroscopy

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      Abstract: Publication date: Available online 8 February 2024Source: Solid-State ElectronicsAuthor(s): Nishant Saini, Davide Tierno, Kristof Croes, Valeri Afanas’ev, Jan Van Houdt
       
  • First-principles screening for sustainable OTS materials

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      Abstract: Publication date: Available online 3 February 2024Source: Solid-State ElectronicsAuthor(s): S. Clima, D. Matsubayashi, T. Ravsher, D. Garbin, R. Delhougne, G.S. Kar, G. Pourtois
       
  • Hot-carrier induced degradation of Ge/STI interfaces in Ge-on-Si junction
           devices

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      Abstract: Publication date: Available online 2 February 2024Source: Solid-State ElectronicsAuthor(s): Solomon Musibau, Jacopo Franco, Artemisia Tsiara, Ingrid De Wolf, Kristof Croes
       
  • Comprehensive evaluation of gate-induced drain leakage in SOI stacked
           nanowire nMOSFETs operating in high-temperatures

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      Abstract: Publication date: Available online 1 February 2024Source: Solid-State ElectronicsAuthor(s): Michelly de Souza, Antonio Cerdeira, Magali Estrada, Mikaël Cassé, Sylvain Barraud, Maud Vinet, Olivier Faynot, Marcelo A. Pavanello
       
  • Characterization of Trap Density in Indium-Gallium-Zinc-Oxide Thin Films
           by Admittance Measurements in Multi-finger MOS Structures

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      Abstract: Publication date: Available online 1 February 2024Source: Solid-State ElectronicsAuthor(s): Hongwei Tang, Attilio Belmonte, Dennis Lin, Valeri Afanas'ev, Patrick Verdonck, Adrian Chasin, Harold Dekkers, Romain Delhougne, Jan Van Houdt, Gouri Sankar Kar
       
  • Preconditioning of Ohmic p-GaN power HEMT for reproducible
           Vth measurements

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      Abstract: Publication date: Available online 30 January 2024Source: Solid-State ElectronicsAuthor(s): L. Ghizzo, D. Trémouilles, F. Richardeau, G. Guibaud
       
  • Influence of gate-source/drain overlap on FeFETs

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      Abstract: Publication date: Available online 26 January 2024Source: Solid-State ElectronicsAuthor(s): Changha Kim, Dong-Oh Kim, Woo Young Choi
       
  • Deep Spiking Neural Networks with Integrate and Fire Neuron Using Steep
           Switching Device

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      Abstract: Publication date: Available online 12 January 2024Source: Solid-State ElectronicsAuthor(s): Sung Yun Woo, Sangyeon Pak, Sung-Tae Lee
       
  • SOS Pseudo-FeFETs after Furnace or Rapid Annealings and Thining by Thermal
           Oxidation

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      Abstract: Publication date: Available online 7 November 2023Source: Solid-State ElectronicsAuthor(s): V.A. Antonov, F.V. Tikhonenko, V.P. Popov, A.V. Miakonkikh, K.V. Rudenko, V.A. Sverdlov
       
 
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  Subjects -> ELECTRONICS (Total: 207 journals)
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