A  B  C  D  E  F  G  H  I  J  K  L  M  N  O  P  Q  R  S  T  U  V  W  X  Y  Z  

  Subjects -> ELECTRONICS (Total: 207 journals)
The end of the list has been reached or no journals were found for your choice.
Similar Journals
Journal Cover
Solid-State Electronics
Journal Prestige (SJR): 0.492
Citation Impact (citeScore): 2
Number of Followers: 10  
 
  Hybrid Journal Hybrid journal (It can contain Open Access articles)
ISSN (Print) 0038-1101 - ISSN (Online) 0038-1101
Published by Elsevier Homepage  [2974 journals]
  • Improved ISPP Scheme for Narrow Threshold Voltage Distribution in 3-D NAND
           Flash Memory

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 28 January 2023Source: Solid-State ElectronicsAuthor(s): Giho Yang, Chanyang Park, Kihoon Nam, Donghyun Kim, Min Sang Park, Rock-Hyun Baek
       
  • Strategies for Ultra-Fast Bit Generation of Two-Terminal Threshold
           Switch-Based True Random Number Generator using Drift-Free Ge-doped SiO2
           Threshold Switch Device

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 25 January 2023Source: Solid-State ElectronicsAuthor(s): Seungwoo Lee
       
  • Stochastic switching of memristors and consideration in circuit simulation

    • Free pre-print version: Loading...

      Abstract: Publication date: March 2023Source: Solid-State Electronics, Volume 201Author(s): Alexander Kloes, Carl Bischoff, Jakob Leise, Emilio Perez-Bosch Quesada, Christian Wenger, Eduardo Perez
       
  • Implantation-free SiC thyristor with single-mask 3D termination near
           10 kV

    • Free pre-print version: Loading...

      Abstract: Publication date: March 2023Source: Solid-State Electronics, Volume 201Author(s): Hu Long, Na Ren, Kuang Sheng
       
  • Turn-around of threshold voltage shift in amorphous InGaZnO TFT under
           positive bias illumination stress

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 20 January 2023Source: Solid-State ElectronicsAuthor(s): Juwon Kim, Hyunjin Kim, Jungyeop Oh, Sung-Yool Choi, Hamin Park
       
  • Multi-state tunnel field effect transistor based on face tunneling with
           gate-source overlap

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 14 January 2023Source: Solid-State ElectronicsAuthor(s): Jiale Sun, Yuming Zhang, Hongliang Lv, Zhijun Lyu, Bin Lu, Yi Zhu, Yuche Pan
       
  • Influence of AlGaN n-type doping and AlN thickness on the two-dimensional
           electron gas density (ns) and resistance (R2DEG)

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 12 January 2023Source: Solid-State ElectronicsAuthor(s): C. Piotrowicz, B. Mohamad, N. Malbert, M.-A. Jaud, W. Vandendaele, M. Charles, R. Gwoziecki
       
  • Editorial: Selected papers from the 8th Joint International EUROSOI
           Workshop and International Conference on Ultimate Integration on Silicon
           (EUROSOI-ULIS 2022)

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 10 January 2023Source: Solid-State ElectronicsAuthor(s): Francesco Driussi, David Esseni, Daniel Lizzit, Pierpaolo Palestri
       
  • Design of auto-store circuit for nvSRAM with SONOS access transistor

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 9 January 2023Source: Solid-State ElectronicsAuthor(s): Woonsan Ko, Jaeyoung Sung, Junkyo Jeong, Jaehyuk Ahn, Hideok Lee, Gawon Lee
       
  • The influence of interface effects on the switching behavior in
           ultra-scaled MRAM cells

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 9 January 2023Source: Solid-State ElectronicsAuthor(s): M. Bendra, S. Fiorentini, W. Goes, S. Selberherr, V. Sverdlov
       
  • The Study of Hot Carrier Effects on Double SOI NMOSFETs

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 7 January 2023Source: Solid-State ElectronicsAuthor(s): Xinyi Zhang, Jianhui Bu, Kewei Wang, Jiangjiang Li, Chengcheng Wang, Bo Li, Fazhan Zhao, Zhengsheng Han
       
  • Graph-based Compact Modeling (GCM) of CMOS transistors for efficient
           parameter extraction: A machine learning approach

    • Free pre-print version: Loading...

      Abstract: Publication date: March 2023Source: Solid-State Electronics, Volume 201Author(s): Amol D. Gaidhane, Ziyao Yang, Yu Cao
       
  • In-depth static and low frequency noise assessment of p-channel
           gate-all-around vertically stacked silicon nanosheets

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 4 January 2023Source: Solid-State ElectronicsAuthor(s): B. Cretu, A. Veloso, E. Simoen
       
  • Drain-bias dependence of low-frequency Y22 signals for Fe-related GaN
           traps in GaN HEMTs with different Fe doping concentrations

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 3 January 2023Source: Solid-State ElectronicsAuthor(s): Taiki Nishida, Toshiyuki Oishi, Tomohiro Otsuka, Yutaro Yamaguchi, Masaomi Tsuru, Koji Yamanaka, Saga University, Mitsubishi Electric Corporation
       
  • CARAT - A Reliability Analysis Framework for BTI-HCD Aging in Circuits

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 3 January 2023Source: Solid-State ElectronicsAuthor(s): Prasad Gholve, Payel Chatterjee, Chaitanya Pasupuleti, Hussam Amrouch, Narendra Gangwar, Shouvik Das, Uma Sharma, Victor M van Santen, Souvik Mahapatra
       
  • The impact of electron phonon scattering on transport properties of
           topological insulators: a first principles quantum transport study

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 2 January 2023Source: Solid-State ElectronicsAuthor(s): Elaheh Akhoundi, Michel Houssa, Aryan Afzalian
       
  • TCAD-Based RF performance prediction and process optimization of 3D
           monolithically stacked complementary FET

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 30 December 2022Source: Solid-State ElectronicsAuthor(s): Shu-Wei Chang, Jia-Hon Chou, Wen-Hsi Lee, Yao-Jen Lee, Darsen D. Lu
       
  • Surface scattering impact on Si/TiSi2 contact resistance

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 30 December 2022Source: Solid-State ElectronicsAuthor(s): Kantawong Vuttivorakulchai, Mohammad Ali Pourghaderi, Gwang-Jun Kim, Seunghyun Song, Yoon-Suk Kim, Uihui Kwon, Dae Sin Kim
       
  • A Simulation Methodology for Superconducting Qubit Readout Fidelity

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 30 December 2022Source: Solid-State ElectronicsAuthor(s): Hiu Yung Wong, Prabjot Dhillon, Kristin M. Beck, Yaniv Jacob Rosen
       
  • Negative Capacitance Field-Effect Transistor with Hetero-Dielectric
           Structure for Suppression of Reverse Drain Induced Barrier Lowering

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 29 December 2022Source: Solid-State ElectronicsAuthor(s): Dong-Oh Kim, Kitae Lee, Changha Kim, Sihyun Kim, Hyun-Min Kim, Daewoong Kwon, Byung-Gook Park
       
  • Modeling incomplete conformality during atomic layer deposition in high
           aspect ratio structures

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 28 December 2022Source: Solid-State ElectronicsAuthor(s): Luiz Felipe Aguinsky, Frâncio Rodrigues, Tobias Reiter, Xaver Klemenschits, Lado Filipovic, Andreas Hössinger, Josef Weinbub
       
  • Device and circuit-level evaluation of a zero-cost transistor architecture
           developed via process optimization

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 28 December 2022Source: Solid-State ElectronicsAuthor(s): Paul Devoge, Hassen Aziza, Philippe Lorenzini, Pascal Masson, Alexandre Malherbe, Franck Julien, Abderrezak Marzaki, Arnaud Regnier, Stephan Niel
       
  • Influence of polarization Coulomb field scattering on the electrical
           properties of normally-off recessed gate AlGaN/GaN
           metal–insulator–semiconductor high-electron-mobility transistor with
           ALD-Al2O3 gate dielectric stack

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 23 December 2022Source: Solid-State ElectronicsAuthor(s): Guangyuan Jiang, Peng Cui, Yang Liu, Guang Yang, Yuanjie Lv, Chen Fu, Guangyuan Zhang, Zhaojun Lin
       
  • 3D-TCAD benchmark of two-gate dual-doped Reconfigurable FETs on FDSOI28
           technology

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 23 December 2022Source: Solid-State ElectronicsAuthor(s): C. Navarro, L. Donetti, J.L. Padilla, C. Medina-Bailon, J.C. Galdon, C. Marquez, C. Sampedro, F. Gamiz
       
  • Impact of the Channel Doping on the Low-Frequency Noise of Gate-All-Around
           Silicon Vertical Nanowire pMOSFETs

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 21 December 2022Source: Solid-State ElectronicsAuthor(s): Eddy Simoen, Anabela Veloso, Philippe Matagne, Cor Claeys
       
  • Improvement of On-cell Metrology Using Spectral Imaging with TCAD Modeling

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 21 December 2022Source: Solid-State ElectronicsAuthor(s): Byungseong Ahn, Kwangseok Lee, Jaehun Yang, Jiseong Doh, Jaehoon Jeong, Taeshin Kwag, Minseok Kim, Yeonjeong Kim, Jongchul Kim, Hyung Keun Yoo, Dae Sin Kim
       
  • A Simulation Physics-Guided Neural Network for Predicting Semiconductor
           Structure with Few Experimental Data

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 21 December 2022Source: Solid-State ElectronicsAuthor(s): QHwan Kim, Sunghee Lee, Ami Ma, Jaeyoon Kim, Hyeon-Kyun Noh, Kyu Baik Chang, Wooyoung Cheon, Shinwook Yi, Jaehoon Jeong, BongSeok Kim, Young-Seok Kim, Dae Sin Kim
       
  • 28nm FD-SOI MEOL Parasitic Capacitance Segmentation using Electrical
           Testing and Semiconductor Process Modeling

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 17 December 2022Source: Solid-State ElectronicsAuthor(s): B. Vianne, B. Guillo-Lohan, V. Quenette, B. Legoix, B. Vincent
       
  • Performance Enhancement for AlGaN/GaN HEMTs with Dual Discrete Field-plate

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 17 December 2022Source: Solid-State ElectronicsAuthor(s): Yunlu Zhou, Jian Qin, Zijing Xie, Hong Wang
       
  • Modeling of SiC transistor with counter-doped channel

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 15 December 2022Source: Solid-State ElectronicsAuthor(s): Pratik B. Vyas, Ashish Pal, Stephen Weeks, Joshua Holt, Aseem K. Srivastava, Ludovico Megalini, Siddharth Krishnan, Michael Chudzik, El Mehdi Bazizi, Buvna Ayyagari-Sangamalli
       
  • Novel experimental methodologies to reconcile large- and small-signal
           responses of Hafnium-based Ferroelectric Tunnel Junctions

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 14 December 2022Source: Solid-State ElectronicsAuthor(s): Marco Massarotto, Francesco Driussi, Antonio Affanni, Suzanne Lancaster, Stefan Slesazeck, Thomas Mikolajick, David Esseni
       
  • Sensitivity enhancement in OCD metrology by optimizing azimuth angle based
           on the RCWA simulation

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 13 December 2022Source: Solid-State ElectronicsAuthor(s): Hyunsuk Choi, Kwangseok Lee, Jiseong Doh, Jaehoon Jeong, Taeshin Kwag, Minseok Kim, Yeonjeong Kim, Jongchul Kim, Hyung Keun Yoo, Dae Sin Kim
       
  • A Physics-based TCAD Framework for NBTI

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 13 December 2022Source: Solid-State ElectronicsAuthor(s): Ravi Tiwari, Meng Duan, Mohit Bajaj, Denis Dolgos, Lee Smith, Hiu Yung Wong, Souvik Mahapatra
       
  • Effect of Layer-specific Synaptic Retention Characteristics on the
           Accuracy of Deep Neural Networks

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 12 December 2022Source: Solid-State ElectronicsAuthor(s): Ho-Nam Yoo, Min-Kyu Park, Byung-Gook Park, Jong-Ho Lee
       
  • New Insights into Low Frequency Noise (LFN) Sources Analysis in GaN/Si
           MIS-HEMTs

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 9 December 2022Source: Solid-State ElectronicsAuthor(s): R. Kom Kammeugne, C. Theodorou, C. Leroux, L. Vauche, X. Mescot, R. Gwoziecki, S. Becu, M. Charles, E. Bano, G. Ghibaudo
       
  • A generalizable TCAD framework for silicon FinFET spin qubit devices with
           electrical control

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 9 December 2022Source: Solid-State ElectronicsAuthor(s): Qian Ding, Andreas V. Kuhlmann, Andreas Fuhrer, Andreas Schenk
       
  • Synaptic array using multi-level AND flash memory cells for hardware-based
           neural networks

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 9 December 2022Source: Solid-State ElectronicsAuthor(s): Soochang Lee, Seongbin Oh, Sung Yun Woo, Byung-Gook Park, Jong-Ho Lee
       
  • The Core-Shell Junctionless MOSFET

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 9 December 2022Source: Solid-State ElectronicsAuthor(s): Sorin Cristoloveanu, Gérard Ghibaudo
       
  • Ferroelectric FDSOI FET modeling for memory and logic appliations

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 9 December 2022Source: Solid-State ElectronicsAuthor(s): Swetaki Chatterjee, Shubham Kumar, Amol Gaidhane, Chetan Kumar Dabhi, Yogesh Singh Chauhan, Hussam Amrouch
       
  • A proposal of quantum computing algorithm to solve Poisson equation for
           nanoscale devices under Neumann boundary condition

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 9 December 2022Source: Solid-State ElectronicsAuthor(s): Shingo Matsuo, Satofumi Souma
       
  • Effects of oxygen gas in the sputtering process of the WO3 sensing layer
           on NO2 sensing characteristics of the FET-type gas sensor

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 8 December 2022Source: Solid-State ElectronicsAuthor(s): Yujeong Jeong, Seongbin Hong, Gyuweon Jung, Wonjun Shin, Chayoung Lee, Jinwoo Park, Donghee Kim, Jong-Ho Lee
       
  • Hybrid 2D/3D mesh for efficient device simulation of locally deformed
           cylindrical semiconductor devices

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 8 December 2022Source: Solid-State ElectronicsAuthor(s): Geon-Tae Jang, Sung-Min Hong
       
  • Comparative analysis of NBTI modeling frameworks BAT and Comphy

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 5 December 2022Source: Solid-State ElectronicsAuthor(s): Aseer Israr Ansari, Nilotpal Choudhury, Narendra Parihar, Souvik Mahapatra
       
  • Trap and Self-Heating Effect Based Reliability Analysis to Reveal Early
           Aging Effect in Nanosheet FET

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 1 December 2022Source: Solid-State ElectronicsAuthor(s): Sunil Rathore, Rajeewa Kumar Jaisawal, P.N. Kondekar, Navjeet Bagga
       
  • Non-local Transport Effects in Semiconductors Under Low-Field Conditions

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 1 December 2022Source: Solid-State ElectronicsAuthor(s): M.G. Ancona, S.J. Cooke
       
  • Performance of Vertical Gate-All-Around Nanowire p–MOS Transistors
           Determined by Boron Depletion during Oxidation

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 30 November 2022Source: Solid-State ElectronicsAuthor(s): Chiara Rossi, Alexander Burenkov, Peter Pichler, Eberhard Bär, Jonas Müller, Guilhem Larrieu
       
  • Transcapacitances Modelling in ultra-thin gate-all-around junctionless
           nanowire FETs, including 2D quantum confinement

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 30 November 2022Source: Solid-State ElectronicsAuthor(s): Wisam Alshebly, Majid Shalchian, Danial Shafizade, Amirali Chalechale, Farzan Jazaeri
       
  • Macroscopic Analysis and Design of Si HFGFET Gas Sensor for Sensitive Gas
           Detection

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 28 November 2022Source: Solid-State ElectronicsAuthor(s): Seongbin Hong, Yujeong Jeong, Gyuweon Jung, Wonjun Shin, Jinwoo Park, Donghee Kim, Chayoung Lee, Jong-Ho Lee
       
  • Compact modeling of photonic devices in Verilog-A for integrated circuit
           design

    • Free pre-print version: Loading...

      Abstract: Publication date: February 2023Source: Solid-State Electronics, Volume 200Author(s): Emeric de Foucauld, Olivier Rozeau, André Myko, Daivid Fowler, Léopold Virot, Fabien Gays
       
  • Coupling a phase field model with an electro-thermal solver to simulate
           PCM intermediate resistance states for neuromorphic computing

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 25 November 2022Source: Solid-State ElectronicsAuthor(s): O. Cueto, A. Trabelsi, C. Cagli, M.C. Cyrille
       
  • H2S Gas Sensing Properties in Polysilicon Control-Gate FET-type
           Gas Sensor

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 25 November 2022Source: Solid-State ElectronicsAuthor(s): Jinwoo Park, Seongbin Hong, Yujeong Jeong, Gyuweon Jung, Wonjun Shin, Donghee Kim, Chayoung Lee, Jong-Ho Lee
       
  • Building robust machine learning force fields by composite Gaussian
           approximation potentials

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 24 November 2022Source: Solid-State ElectronicsAuthor(s): Diego Milardovich, Dominic Waldhoer, Markus Jech, Al-Moatasem Bellah El-Sayed, Tibor Grasser
       
  • Microstructural impact on electromigration reliability of gold
           interconnects

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 24 November 2022Source: Solid-State ElectronicsAuthor(s): H. Ceric, R.L. de Orio, S. Selberherr
       
  • Automatic grid refinement for thin material layer etching in process TCAD
           simulations

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 24 November 2022Source: Solid-State ElectronicsAuthor(s): Christoph Lenz, Paul Manstetten, Luiz Felipe Aguinsky, Francio Rodrigues, Andreas Hössinger, Josef Weinbub
       
  • A novel ferroelectric nanopillar multi-level cell memory

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 23 November 2022Source: Solid-State ElectronicsAuthor(s): Hyeongu Lee, Mincheol Shin
       
  • δ -layer+systems&rft.title=Solid-State+Electronics&rft.issn=0038-1101&rft.date=&rft.volume=">Strong quantization of current-carrying electron states in δ -layer
           systems

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 23 November 2022Source: Solid-State ElectronicsAuthor(s): Denis Mamaluy, Juan P. Mendez
       
  • Prediction of the evolution of defects induced by the heated implantation
           process: Contribution of kinetic Monte Carlo in a multi-scale modeling
           framework

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 22 November 2022Source: Solid-State ElectronicsAuthor(s): P.L. Julliard, A. Johnsson, N. Zographos, R. Demoulin, R. Monflier, A. Jay, O. Er-Riyahi, F. Monsieur, S. Joblot, F. Deprat, D. Rideau, P. Pichler, A. Hémeryck, F. Cristiano
       
  • Analysis of 1/f and G-R noise in Phosphorene FETs

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 21 November 2022Source: Solid-State ElectronicsAuthor(s): Adhithan Pon, M. Ehteshamuddin, Kumar Sheelvardhan, Avirup Dasgupta
       
  • Discontinuous Galerkin concept for Quantum-Liouville type equations

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 21 November 2022Source: Solid-State ElectronicsAuthor(s): Valmir Ganiu, Dirk Schulz
       
  • Electrical instabilities in amorphous Si-Zn-Sn-O thin film transistors
           under ultra-violet irradiation depending on oxygen content

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 19 November 2022Source: Solid-State ElectronicsAuthor(s): Balaji Murugan, Sang Yeol Lee
       
  • Hierarchical Modeling for TCAD Simulation of Short-Channel 2D
           Material-Based FETs

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 17 November 2022Source: Solid-State ElectronicsAuthor(s): Luca Silvestri, Mattias Palsgaard, Reto Rhyner, Martin Frey, Jess Wellendorff, Søren Smidstrup, Ronald Gull, Karim El Sayed
       
  • Investigation of effects of lateral boundary conditions on current
           filament movements in Trench-Gate IGBTs

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 17 November 2022Source: Solid-State ElectronicsAuthor(s): Takeshi Suwa
       
  • Modeling thermal effects in STT-MRAM

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 16 November 2022Source: Solid-State ElectronicsAuthor(s): Tomáš Hadámek, Siegfried Selberherr, Wolfgang Goes, Viktor Sverdlov
       
  • Deriving a novel methodology for Nano-BioFETs and analysing the effect of
           high-k oxides on the amino-acids sensing application

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 14 November 2022Source: Solid-State ElectronicsAuthor(s): Rakshita Dhar, Naveen Kumar, Cesar Pascual Garcia, Vihar Georgiev
       
  • Theoretical Study of Carrier Transport in Supported and Gated
           Two-dimensional Transition Metal Dichalcogenides

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 30 October 2022Source: Solid-State ElectronicsAuthor(s): Sanjay Gopalan, Maarten L. Van de Put, Gautam Gaddemane, Massimo V. Fischetti
       
  • TCAD-based design and verification of the components of a 200 V GaN-IC
           platform

    • Free pre-print version: Loading...

      Abstract: Publication date: Available online 28 October 2022Source: Solid-State ElectronicsAuthor(s): Pavan Vudumula, Thibault Cosnier, Olga Syshchyk, Benoit Bakeroot, Stefaan Decoutere
       
 
JournalTOCs
School of Mathematical and Computer Sciences
Heriot-Watt University
Edinburgh, EH14 4AS, UK
Email: journaltocs@hw.ac.uk
Tel: +00 44 (0)131 4513762
 


Your IP address: 3.235.195.196
 
Home (Search)
API
About JournalTOCs
News (blog, publications)
JournalTOCs on Twitter   JournalTOCs on Facebook

JournalTOCs © 2009-