 Subjects -> ELECTRONICS (Total: 207 journals)
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- Reliability studies on bipolar transistors under different particles
radiation-
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Abstract: Publication date: August 2023Source: Solid-State Electronics, Volume 206Author(s): Vinayakprasanna N. Hegde, T.M. Pradeep, M.N. Bharathi, Jhon D. Cressler, A.P. Gnana Prakash
- Synaptic effect and non-volatile switching modulated by
LiCoO2/boehmite composite layer-
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Abstract: Publication date: Available online 26 May 2023Source: Solid-State ElectronicsAuthor(s): Weijie Duan, Zhixin Zhang, Liang He, Yanpeng Hong
- Simulation study on physical parameters ruling unipolar resistance
switching of sputter-deposited silicon oxide film on Si substrate-
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Abstract: Publication date: Available online 26 May 2023Source: Solid-State ElectronicsAuthor(s): Yasuhisa Omura, Abhijit Mallik
- Performance of Flexible In0.7Ga0.3As MOSFETs by Utilizing Liquid Polyimide
(LPI) Transfer with Effective Mobility of 3,667 cm2/V-s-
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Abstract: Publication date: Available online 25 May 2023Source: Solid-State ElectronicsAuthor(s): Do-Kywn Kim, Saungeun Park, Jae-Phil Shim, Seung Heon Shin
- Design Consideration of Ferroelectric Field-Effect-Transistors with
Metal–Ferroelectric–Metal Capacitorory-
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Abstract: Publication date: Available online 24 May 2023Source: Solid-State ElectronicsAuthor(s): Boram Yi, Junghyeon Hwang, Tae Woo Oh, Sanghun Jeon, Seong-Ook Jung, Ji-Woon Yang
- Influence of metal capping thin film transistor with different Si
concentration in ZnSnO-
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Abstract: Publication date: Available online 23 May 2023Source: Solid-State ElectronicsAuthor(s): Ji Ye Lee, Byeong-Kwon Ju, Sang Yeol Lee
- An analytical model for the body contact current of PDSOI nMOSFETs
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Abstract: Publication date: Available online 20 May 2023Source: Solid-State ElectronicsAuthor(s): Xiaonian Liu, Xiangliang Jin, Zhiwei Zheng, Jun Dong
- Assessment of the variability of the I-V characteristic of HfO2-based
resistive switching devices and its simulation using the quasi-static
memdiode model-
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Abstract: Publication date: Available online 11 May 2023Source: Solid-State ElectronicsAuthor(s): E. Salvador, M.B. Gonzalez, F. Campabadal, J. Martin-Martinez, R. Rodriguez, E. Miranda
- Experimental investigation of time dependent dielectric breakdown and
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Abstract: Publication date: Available online 2 May 2023Source: Solid-State ElectronicsAuthor(s): Ran Cheng, Xinze Li, Yiqin Zeng, Xiao Yu, Yue Peng, Bing Chen, Genquan Han
- Improved responsivity and detectivity of LPE HgCdTe short-wavelength
infrared photodetector by tuning the composition gradient-
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Abstract: Publication date: Available online 23 April 2023Source: Solid-State ElectronicsAuthor(s): Dan Yang, Jiamu Lin, Chun Lin, Xi Wang, Songmin Zhou, Huijun Guo, Ruijun Ding, Li He
- High-Resistivity with PN Interface Passivation in 22 nm FD-SOI technology
for Low-Loss Passives at RF and Millimeter-Wave Frequencies-
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Abstract: Publication date: Available online 21 April 2023Source: Solid-State ElectronicsAuthor(s): L. Nyssens, M. Rack, M. Nabet, C. Schwan, Z. Zhao, S. Lehmann, T. Herrmann, D. Henke, A. Kondrat, C. Soonekindt, F. Koch, T. Kache, D.P. Kini, O. Zimmerhackl, F. Allibert, C. Aulnette, D. Lederer, J.-P. Raskin
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Hybrid journal (It can contain Open Access articles)
