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Advanced Structural and Chemical Imaging
Number of Followers: 2

This is an Open Access Journal

Open Access journal
ISSN (Online) 2198-0926
Published by SpringerOpen

[228 journals]

Detection of defects in atomic-resolution images of materials using cycle
analysis
- Authors: Oleg S. Ovchinnikov; Andrew O’Hara, Stephen Jesse, Bethany M. Hudak, Shi‐Ze Yang, Andrew R. Lupini, Matthew F. Chisholm, Wu Zhou, Sergei V. Kalinin, Albina Y. Borisevich Sokrates T. Pantelides
  Abstract: The automated detection of defects in high-angle annular dark-field Z-contrast (HAADF) scanning-transmission-electron microscopy (STEM) images has been a major challenge. Here, we report an approach for the autom...
  PubDate: 2020-03-30T00:00:00Z
Imaging of polymer:fullerene bulk-heterojunctions in a scanning electron
microscope: methodology aspects and nanomorphology by correlative SEM and
STEM
- Authors: Yonghe Li; Erich Müller, Christian Sprau, Alexander Colsmann Dagmar Gerthsen
  Abstract: Scanning transmission electron microscopy (STEM) at low energies (≤ 30 keV) in a scanning electron microscope is well suited to distinguish weakly scattering materials with similar materials properties and ana...
  PubDate: 2020-03-04T00:00:00Z
mpfit: a robust method for fitting atomic resolution images with multiple
Gaussian peaks
- Authors: Debangshu Mukherjee; Leixin Miao, Greg Stone Nasim Alem
  Abstract: The standard technique for sub-pixel estimation of atom positions from atomic resolution scanning transmission electron microscopy images relies on fitting intensity maxima or minima with a two-dimensional Gau...
  PubDate: 2020-01-27T00:00:00Z
Investigation of hole-free phase plate performance in transmission
electron microscopy under different operation conditions by experiments
and simulations
- Authors: Rebecca Pretzsch; Manuel Dries, Simon Hettler, Martin Spiecker, Martin Obermair Dagmar Gerthsen
  Abstract: Hole-free phase plates (HFPPs), also known as Volta phase plates, were already demonstrated to be well suited for in-focus transmission electron microscopy imaging of organic objects. However, the underlying p...
  PubDate: 2019-10-01T00:00:00Z
Optimal principal component analysis of STEM XEDS spectrum images
- Authors: Pavel Potapov; Axel Lubk
  Abstract: STEM XEDS spectrum images can be drastically denoised by application of the principal component analysis (PCA). This paper looks inside the PCA workflow step by step on an example of a complex semiconductor st...
  PubDate: 2019-04-09T00:00:00Z

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