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  Subjects -> ENGINEERING (Total: 1962 journals)
    - CHEMICAL ENGINEERING (151 journals)
    - CIVIL ENGINEERING (149 journals)
    - ELECTRICAL ENGINEERING (82 journals)
    - ENGINEERING (1119 journals)
    - ENGINEERING MECHANICS AND MATERIALS (290 journals)
    - HYDRAULIC ENGINEERING (45 journals)
    - INDUSTRIAL ENGINEERING (52 journals)
    - MECHANICAL ENGINEERING (74 journals)

ENGINEERING (1119 journals)            First | 2 3 4 5 6 7 8 9 | Last

International Journal of Intelligent Engineering Informatics     Hybrid Journal  
International Journal of Intelligent Systems and Applications in Engineering     Open Access   (Followers: 1)
International Journal of Lifecycle Performance Engineering     Hybrid Journal  
International Journal of Machine Tools and Manufacture     Hybrid Journal   (Followers: 4)
International Journal of Manufacturing Research     Hybrid Journal   (Followers: 7)
International Journal of Manufacturing Technology and Management     Hybrid Journal   (Followers: 9)
International Journal of Materials and Product Technology     Hybrid Journal   (Followers: 4)
International Journal of Mathematical Education in Science and Technology     Hybrid Journal   (Followers: 6)
International Journal of Mathematics in Operational Research     Hybrid Journal   (Followers: 1)
International Journal of Medical Engineering and Informatics     Hybrid Journal   (Followers: 5)
International Journal of Micro Air Vehicles     Full-text available via subscription   (Followers: 3)
International Journal of Microwave and Wireless Technologies     Hybrid Journal   (Followers: 1)
International Journal of Microwave Science and Technology     Open Access   (Followers: 2)
International Journal of Mobile Network Design and Innovation     Hybrid Journal   (Followers: 3)
International Journal of Multiphase Flow     Hybrid Journal   (Followers: 2)
International Journal of Nanomanufacturing     Hybrid Journal   (Followers: 1)
International Journal of Nanoscience     Hybrid Journal   (Followers: 1)
International Journal of Nanotechnology     Hybrid Journal   (Followers: 4)
International Journal of Navigation and Observation     Open Access   (Followers: 5)
International Journal of Network Management     Hybrid Journal  
International Journal of Nonlinear Sciences and Numerical Simulation     Full-text available via subscription   (Followers: 1)
International Journal of Numerical Methods for Heat & Fluid Flow     Hybrid Journal   (Followers: 7)
International Journal of Optics     Open Access   (Followers: 1)
International Journal of Organisational Design and Engineering     Hybrid Journal   (Followers: 8)
International Journal of Pattern Recognition and Artificial Intelligence     Hybrid Journal   (Followers: 6)
International Journal of Pavement Engineering     Hybrid Journal   (Followers: 2)
International Journal of Physical Modelling in Geotechnics     Hybrid Journal   (Followers: 3)
International Journal of Plasticity     Hybrid Journal   (Followers: 6)
International Journal of Plastics Technology     Hybrid Journal  
International Journal of Polymer Analysis and Characterization     Hybrid Journal   (Followers: 3)
International Journal of Polymer Science     Open Access   (Followers: 16)
International Journal of Precision Engineering and Manufacturing     Hybrid Journal   (Followers: 7)
International Journal of Precision Technology     Hybrid Journal  
International Journal of Pressure Vessels and Piping     Hybrid Journal   (Followers: 2)
International Journal of Production Economics     Hybrid Journal   (Followers: 10)
International Journal of Quality and Innovation     Hybrid Journal   (Followers: 2)
International Journal of Quality Engineering and Technology     Hybrid Journal   (Followers: 2)
International Journal of Quantum Information     Hybrid Journal  
International Journal of Rapid Manufacturing     Hybrid Journal   (Followers: 3)
International Journal of Reliability, Quality and Safety Engineering     Hybrid Journal   (Followers: 4)
International Journal of Renewable Energy Technology     Hybrid Journal   (Followers: 7)
International Journal of Robust and Nonlinear Control     Hybrid Journal   (Followers: 2)
International Journal of Science Engineering and Advance Technology     Open Access  
International Journal of Sediment Research     Full-text available via subscription   (Followers: 1)
International Journal of Self-Propagating High-Temperature Synthesis     Hybrid Journal   (Followers: 2)
International Journal of Signal and Imaging Systems Engineering     Hybrid Journal  
International Journal of Six Sigma and Competitive Advantage     Hybrid Journal  
International Journal of Social Robotics     Hybrid Journal   (Followers: 1)
International Journal of Software Engineering and Knowledge Engineering     Hybrid Journal   (Followers: 1)
International Journal of Space Science and Engineering     Hybrid Journal   (Followers: 2)
International Journal of Speech Technology     Hybrid Journal   (Followers: 2)
International Journal of Spray and Combustion Dynamics     Full-text available via subscription   (Followers: 5)
International Journal of Surface Engineering and Interdisciplinary Materials Science     Full-text available via subscription   (Followers: 1)
International Journal of Surface Science and Engineering     Hybrid Journal   (Followers: 7)
International Journal of Sustainable Engineering     Hybrid Journal   (Followers: 7)
International Journal of Sustainable Manufacturing     Hybrid Journal   (Followers: 4)
International Journal of Systems Assurance Engineering and Management     Hybrid Journal  
International Journal of Systems, Control and Communications     Hybrid Journal   (Followers: 2)
International Journal of Technology Management and Sustainable Development     Hybrid Journal   (Followers: 1)
International Journal of Technology Policy and Law     Hybrid Journal   (Followers: 4)
International Journal of Telemedicine and Applications     Open Access   (Followers: 2)
International Journal of Thermal Sciences     Hybrid Journal   (Followers: 4)
International Journal of Thermodynamics     Open Access   (Followers: 2)
International Journal of Turbo & Jet-Engines     Full-text available via subscription  
International Journal of Ultra Wideband Communications and Systems     Hybrid Journal  
International Journal of Vehicle Autonomous Systems     Hybrid Journal   (Followers: 1)
International Journal of Vehicle Design     Hybrid Journal   (Followers: 6)
International Journal of Vehicle Information and Communication Systems     Hybrid Journal   (Followers: 2)
International Journal of Vehicle Noise and Vibration     Hybrid Journal   (Followers: 3)
International Journal of Vehicle Safety     Hybrid Journal   (Followers: 4)
International Journal of Vehicular Technology     Open Access   (Followers: 1)
International Journal of Virtual Technology and Multimedia     Hybrid Journal   (Followers: 4)
International Journal of Wavelets, Multiresolution and Information Processing     Hybrid Journal  
International Journal on Artificial Intelligence Tools     Hybrid Journal   (Followers: 4)
International Nano Letters     Open Access   (Followers: 5)
International Review of Applied Sciences and Engineering     Full-text available via subscription  
Inverse Problems in Science and Engineering     Hybrid Journal   (Followers: 2)
Ionics     Hybrid Journal  
IPTEK The Journal for Technology and Science     Open Access  
IRBM News     Full-text available via subscription  
Ironmaking & Steelmaking     Hybrid Journal   (Followers: 2)
Irrigation and Drainage Systems     Hybrid Journal  
ISA Transactions     Full-text available via subscription  
ISRN - International Scholarly Research Notices     Open Access   (Followers: 69)
ISRN Signal Processing     Open Access  
IT Professional     Full-text available via subscription   (Followers: 2)
Journal of Biosensors & Bioelectronics     Open Access   (Followers: 1)
Journal of Advanced Manufacturing Systems     Hybrid Journal   (Followers: 8)
Journal of Aerosol Science     Hybrid Journal   (Followers: 2)
Journal of Aerospace Engineering     Full-text available via subscription   (Followers: 111)
Journal of Alloys and Compounds     Hybrid Journal   (Followers: 6)
Journal of Analytical and Applied Pyrolysis     Hybrid Journal   (Followers: 3)
Journal of Analytical Science & Technology     Open Access   (Followers: 4)
Journal of Analytical Sciences, Methods and Instrumentation     Open Access   (Followers: 1)
Journal of Applied Analysis     Full-text available via subscription  
Journal of Applied and Industrial Sciences     Open Access  
Journal of Applied Logic     Full-text available via subscription  
Journal of Applied Physics     Hybrid Journal   (Followers: 138)
Journal of Applied Probability     Full-text available via subscription   (Followers: 6)
Journal of Applied Research and Technology     Open Access  

  First | 2 3 4 5 6 7 8 9 | Last

Journal Cover Journal of Electronic Testing
   [3 followers]  Follow    
   Hybrid Journal Hybrid journal (It can contain Open Access articles)
     ISSN (Print) 1573-0727 - ISSN (Online) 0923-8174
     Published by Springer-Verlag Homepage  [2209 journals]   [SJR: 0.424]   [H-I: 22]
  • Low-Power Scan Testing: A Scan Chain Partitioning and Scan Hold Based
           Technique
    • Abstract: Abstract Power consumption during scan testing operations can be significantly higher than that expected in the normal functional mode of operation in the field. This may affect the reliability of the circuit under test (CUT) and/or invalidate the testing process increasing yield loss. In this paper, a scan chain partitioning technique and a scan hold mechanism are combined for low power scan operation. Substantial power reductions can be achieved, without any impact on the test application time or the fault coverage and without the need to use scan cell reordering or clock and data gating techniques. Furthermore, the proposed design solution for scan power alleviation, permits the efficient exploitation of X-filling techniques for capture power reduction or the use of extreme (power independent) compression techniques for test data volume reduction.
      PubDate: 2014-05-22
       
  • Research on the Efficiency Improvement of Design for Testability Using
           Test Point Allocation
    • Abstract: Abstract Traditional design for testability (DFT) is arduous and time-consuming because of the iterative process of testability assessment and design modification. To improve the DFT efficiency, a DFT process based on test point allocation is proposed. In this process, the set of optimal test points will be automatically allocated according to the signal reachability under the constraints of testability criteria. Thus, the iterative DFT process will be completed by computer and the test engineers will be released to concentrate on the system design rather than the repetitive modification process. To perform test point allocation, the dependency matrix of signal to potential test point (SP-matrix) is defined based on multi-signal flow graph. Then, genetic algorithm (GA) is adopted to search for the optimal test point allocation solution based on the SP-matrix. At last, experiment is carried out to evaluate the effectiveness of the algorithm.
      PubDate: 2014-05-20
       
  • The Effect of Temperature-Induced Quiescent Operating Point Shift on
           Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits
    • Abstract: Abstract This paper discusses the different sensitivities of laser-induced single-event transients (SET) with changed temperature (from 300 to 348 K) for an analog/mixed-signal DC/DC PWM controller IC. Basic analog circuits, such as the amplifier, the comparator, and the current mirror, are selected to perform the experiment. The SET energies for some devices decrease while those for others remain constant. The spice simulation implies that the temperature-induced quiescent operating point shift can dramatically affect the SET sensitivity, especially in a complex analog/mixed-signal system. This effect also gives insights on radiation hardened design and testing in analog/mixed-signal circuits.
      PubDate: 2014-05-15
       
  • Low Cost Signal Reconstruction Based Testing of RF Components using
           Incoherent Undersampling
    • Abstract: Abstract To meet the testing requirements of high speed components used in modern communication systems, in an efficient and cost effective manner, it is necessary to develop new device performance measurement techniques that are easily scalable to high frequencies. Traditional up/down conversion based transmitter testing architectures are sensitive to the linearity of the mixers and carrier phase noise in the receiver. Direct undersampling based test instrumentation can overcome the limitations imposed by mixers in up/down conversion. A major challenge in direct undersampling based test architecture is to achieve precise phase alignment between different components of the test setup. Such phase alignment of high frequency signals requires the use of expensive test instruments adding to the cost and complexity of the overall test system. To resolve this problem, an incoherent undersampling based test method is developed in this research that eliminates the need for precise phase synchronization between the RF test signal carrier, its amplitude-modulated envelope (generally necessary for measuring amplifier nonlinearity) and the reference sampling clock. A side-benefit, due to the use of signal undersampling, is that signal acquisition is achieved without the use of a Nyquist rate data converter. Multiple RF performance metrics are extracted without the use of a reference receiver. The accuracy of the proposed setup is compared against existing coherent sampling based test setups.
      PubDate: 2014-04-26
       
  • Soft Fault Diagnosis of Analog Circuits via Frequency Response Function
           Measurements
    • Abstract: Abstract This paper provides a novel method for single and multiple soft fault diagnosis of analog circuits. The method is able to locate the faulty elements and evaluate their parameters. It employs the information contained in the frequency response function (FRF) measurements and focuses on finding models of the circuit under test (CUT) as exact as possible. Consequently, the method is capable of getting different sets of the parameters which are consistent with the diagnostic test, rather than only one specific set. To fulfil this purpose, the local plolynomial approach is applied and the associated normalized FRF is developed.The proposed method is especially suitable at the pre-production stage, where corrections of the technological design are important and the diagnostic time is not crucial. Two experimental examples are presented to clarify the proposed method and prove its efficiency.
      PubDate: 2014-04-26
       
  • Test Data Compression for System-on-a-Chip using Count Compatible Pattern
           Run-Length Coding
    • Abstract: Abstract The Count Compatible Pattern Run-Length (CCPRL) coding compression method is proposed to further improve the compression ratio. Firstly, a segment of pattern in the test set is retained. Secondly, don’t-care bits are filled so as to make subsequent patterns compatible with the retained pattern for as many times as possible until it can no longer be made compatible. Thirdly, the compatible patterns are represented by symbol “0” (equal) and symbol “1” (contrary) in the codeword. In addition, the number of consecutive compatible patterns is counted and expanded into binary which indicates when the codeword ends. At last, the six largest ISCAS’89 benchmark circuits verify the proposed method, the experimental results show that the average compression ratio achieved is up to 71.73 %.
      PubDate: 2014-04-23
       
  • An On-Chip Sensor to Monitor NBTI Effects in SRAMs
    • Abstract: Abstract The increasing need to store more and more information has resulted in the fact that Static Random Access Memories (SRAMs) occupy the greatest part of Systems-on-Chip (SoCs). Therefore, SRAM’s robustness is considered crucial in order to guarantee the reliability of such SoCs over lifetime. In this context, one of the most important phenomena that degrades Nano-Scale SRAMs reliability is related to Negative-Bias Temperature Instability (NBTI), which causes the memory cells aging. The main goal of this paper is to present a hardware-based approach able to monitor SRAMs’ aging during the SoC’s lifetime based on the insertion of On-Chip Aging Sensors (OCASs). In more detail, the proposed strategy is based on the connection of one OCAS to every SRAM column, each periodically monitoring write operations on the SRAM cells. It is important to note that in order to prevent the OCAS from aging and to reduce leakage power dissipation, the OCAS circuitry is powered-off during its idle periods. The proposed hardware-based approach has been evaluated throughout SPICE simulations using 65 nm CMOS technology and the results demonstrate the sensor’s capacity to detect early aging states and therefore, guaranteeing high SRAM reliability. To conclude, a complete analysis of the sensor’s overheads is presented.
      PubDate: 2014-04-15
       
  • Editorial
    • PubDate: 2014-04-08
       
  • A Test Time Theorem and its Applications
    • Abstract: Abstract Power dissipated during test is a constraint when it comes to test time reduction. In this work, we show that for a given test the minimum test application time is achieved when the total energy is dissipated evenly at the rate of the maximum allowable power for the device under test. This result, the test time theorem, leads to two alternatives for reducing test time. In the first alternative, we scale the supply voltage down to reduce power, which in turn allows us to increase the clock frequency, of course within the limit imposed by the critical path. Thus, optimum voltage and frequency can be found to minimize the test time of a fixed frequency synchronous test. In the other alternative, which also benefits from the reduced voltage, the clock period is dynamically varied so that each cycle dissipates the maximum allowable power. This test, termed aperiodic clock test, according to the theorem achieves the lower bound on test time. An illustrative example of an ISCAS’89 benchmark circuit shows a test time reductionof 71 %.
      PubDate: 2014-04-01
       
  • Test Technology Newsletter
    • PubDate: 2014-03-28
       
  • Error Correction Schemes with Erasure Information for Fast Memories
    • Abstract: Abstract Two error correction schemes are proposed for word-oriented binary memories that can be affected by erasures, i.e. errors with known location but unknown value. The erasures considered here are due to the drifting of the electrical parameter used to encode information outside the normal ranges associated to a logic 0 or a logic 1 value. For example, a dielectric breakdown in a magnetic memory cell may reduce its electrical resistance sensibly below the levels which correspond to logic 0 and logic 1 values stored in healthy memory cells. Such deviations can be sensed during memory read operations and the acquired information can be used to boost the correction capability of an error-correcting code (ECC). The proposed schemes enable the correction of double-bit errors based on the combination of erasure information with single-bit error correction and double-bit error detection (SEC-DED) codes or shortened (SEC) codes. The correction of single-bit errors is always guaranteed. Ways to increase the number of double-bit and triple-bit errors that can be detected by shortened SEC and SEC-DED codes are considered in order to augment the error correction capability of the proposed solutions.
      PubDate: 2014-03-21
       
  • An RTN Variation Tolerant SRAM Screening Test Design with Gaussian
           Mixtures Approximations of Long-Tail Distributions
    • Abstract: Abstract This paper points out that the ordinary screening-test design (STD) will be no longer available when once the random telegraph noise (RTN) could not be ignored any more, resulting from a significantly increasing of the time-dependent modulation of the overall voltage-margin variations (OVMV). Since the major RTN effect on the OVMV modulation comes up after the screening, the actual precision of the STD must rely entirely upon the estimation accuracy of the RTN effect. The proposed STD is based on the developed statistical convolution model capable of fulfilling the following requirements: (1) precisely approximating the non Gaussian tail distribution of the RTN by simple Gaussian mixtures model (GMM), (2) accurately convoluting the RTN tail with the distribution of the Gaussian random dopant fluctuation (RDF). The proposed concepts are 1) sequentially and adaptively segmentation of the long tailed distributions such that the log-likelihood of the GMM in each segment is maximized. It has been verified that the proposed method can reduce the error of the fail-bit predictions by 3-orders of magnitude at the interest raw score where the fail probability pdf = 10−12 which corresponds to a 99.9 % yield for 1Gbit chips.
      PubDate: 2014-03-11
       
  • Developing Inherently Resilient Software Against Soft-Errors Based on
           Algorithm Level Inherent Features
    • Abstract: Abstract A potential peculiarity of software systems is that a large number of soft-errors are inherently derated (masked) at the software level. The rate of error-deration may depend on the type of algorithms and data structures used in the software. This paper investigates the effects of the underlying algorithms of programs on the rate of error-deration. Eight different benchmark programs were used in the study; each of them was implemented by four different algorithms, i.e. divide-and-conquer, dynamic, backtracking and branch-and-bound. About 10,000 errors were injected into each program in order to quantify and analyze the error-derating capabilities of different algorithm-designing-techniques. The results reveal that about 40.0 % of errors in the dynamic algorithm are derated; this figure for backtracking, branch-and-bound and divide-and-conquer algorithms are 39.5 %, 38.1 % and 28.8 %, respectively. These results can enable software designers and programmers to select the most efficient algorithms for developing inherently resilient programs. Furthermore, an analytical examination of the results using one-way ANOVA acknowledged the statistical significance of difference between the algorithm-designing-techniques in terms of resiliency at 95 % level of confidence.
      PubDate: 2014-02-25
       
  • Editorial
    • PubDate: 2014-02-01
       
  • 2013 Reviewers
    • PubDate: 2014-02-01
       
  • New Editor
    • PubDate: 2014-02-01
       
  • Test Technology Newsletter
    • PubDate: 2014-02-01
       
  • Low Power Memory Built in Self Test Address Generator Using Clock
           Controlled Linear Feedback Shift Registers
    • Abstract: Abstract In the ongoing high-speed, high-tech sophistication in the technology of VLSI designs, Built-in Self-Test (BIST) is emerging as the essential element of the memory, which can be treated as the most essential ingredient of the System on Chip. The market is flooded with diverse algorithms exclusively intended for investigating the memory locations. LFSRs (Linear Feedback Shift Register) are employed extensively for engendering the memory addresses, so that they can be consecutively executed on the memory cores under experimentation. What we have attempted to put forward through this paper is a proposed LFSR based address generator with significant decrease in switching process for low power MBIST (Memory Built in Self Test). In this novel technique, the address models are produced by a blend of LFSR and a 2-bit pattern generator (Modified LFSR) and two distinct clock signals. With the efficient employ of the adapted architecture switching activity is considerably cut down. As the switching activity is in direct proportion to the power consumed scaling down the switching process of the address generator inevitably leads to the reduction in power consumption of the MBIST. In this paper we have taken pains to design and stimulate the proposed address generator by means of Xilinx ISE tools and contrasted it with the switching activities of the conventional LFSR and BS-LFSR (Bit Swapping Linear Feedback Shift Register). The encouraging outcomes illustrate a significant reduction in switching activity, to the tune of 90 % plus of the entire dynamic power in relation to the traditional LFSR.
      PubDate: 2014-02-01
       
  • Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using
           Heavy Ion, Proton, and Pulsed Laser
    • Abstract: Abstract This paper discusses multiple methods of Single-Event Transient (SET) measurements on a commercial DC/DC Pulse Width Modulator (PWM). Heavy ion, proton, and pulsed laser are used in the experiments. The correlations between the heavy ion, pulsed laser and proton data are analyzed and presented. A proton cross-section model is used to derive proton cross-section from heavy ion test data. The calculated result is close to the real proton data, which means the heavy ion and proton data fit well. The relationship between pulsed laser and proton are also analyzed through heavy as a medium.
      PubDate: 2014-01-09
       
  • Wide Dynamic Range CMOS Amplifier Design for RF Signal Power Detection via
           Electro-Thermal Coupling
    • Abstract: Abstract A differential temperature sensor for on-chip signal and DC power monitoring is presented for built-in testing and calibration applications. The amplifiers in the sensor are designed with class AB output stages to extend the dynamic range of the temperature/power measurements. Two high-gain amplification stages are used to achieve high sensitivity to temperature differences at points close to devices under test. Designed in 0.18 μm CMOS technology, the sensor has a simulated sensitivity that is tunable up to 210 mV/°C with a corresponding dynamic range of 13 °C. The sensor consumes 2.23 mW from a 1.8 V supply. A low-power version of the sensor was designed that consumes 1.125 mW from a 1.8 V supply, which has a peak sensitivity of 185.7 mV/°C over a 8 °C dynamic range.
      PubDate: 2013-12-13
       
 
 
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